Journal Papers
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A. K. Henning, N. N. Chan, J. T. Watt and J. D. Plummer, “Substrate current at cryogenic temperatures: Measurements, and a 2-D model for CMOS technology.” IEEE Transactions on Electronic Devices ED-34, pp. 64-74 (1987). Download PDF
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A. K. Henning and J. D. Plummer, “Thermionic emission probability for semiconductor-insulator interfaces.” IEEE Transactions on Electronic Devices ED-34, pp. 2211-2212 (1987). Download PDF
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A. K. Henning and J. L. Dimauro, “Calculation of lateral distribution of interface traps along MIS channel.” Electronics Letters 27, pp. 1445-1447 (1991). Download PDF
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E. Fisch, A. K. Henning, and J. Walsh, “A Cerenkov microlaser.” IEEE J. Quantum Electronics 27, pp. 753-759 (1991). Download PDF
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E. E. Fisch, J. E. Walsh, A. K. Henning, and M. F. Kimmitt, “The semiconductor Cherenkov laser.” Nuclear Instruments and Methods in Physics Research A304, pp. 679-682 (1991). Download PDF
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F. Rodriguez, A. Filimonov, A. Henning, C. Coughlin, M. Greenberg, “Radiation-induced effects in multiprogrammable pacemakers and implantable defibrillators.” Pacing and Clinical Electrophysiology 14, pp. 2143-2153 (1991). Download PDF
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H. F. Wei, A. K. Henning, J. Slinkman, and W. R. Hunter, “A graphical ellipsometric data reduction algorithm and its application in thin SiO2 film measurement.” Journal of the Electrochemical Society 139, pp. 1783-1790 (1992). Download PDF
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X. Tian, F. E. Kennedy, Jr., J. J. Deacutis, and A. K. Henning, “The development and use of thin film thermocouples for contact temperature measurement.” Tribology Transactions 35, pp. 491-499 (1992). Download PDF
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A. K. Henning, T. Hochwitz, J. Slinkman, J. Never, S. Hoffman, P. Kaszuba, and C. Daghlian, “Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy.” Journal of Applied Physics 77, pp. 1888-1896 (1995). Download PDF
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T. Hochwitz, A. K. Henning, C. G. Levey, C. P. Daghlian, J. Slinkman, “Capacitive Effects on Quantitative Dopant Profiling with Scanned Electrostatic Force Microscopes.” Journal of Vacuum Science and Technology B 14, pp. 457-462 (1996). Download PDF
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T. Hochwitz, A. K. Henning, C. G. Levey, C. P. Daghlian, J. Slinkman, James Never, Phil Kaszuba, Randy Wells, John Pekarik, Bob Gluck, “Imaging Dopant Profiles of Integrated Circuit Devices with the Force-Based Scanning Kelvin Probe Microscope.” Journal of Vacuum Science and Technology B 14, pp. 440-446 (1996). Download PDF
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A. K. Henning and T. Hochwitz, “Scanning Probe Microscopy for 2-D Semiconductor Dopant Profiling and Device Failure Analysis.” Materials Science and Engineering B42, pp. 88-98 (1996). Download PDF
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A. K. Henning, J. S. Fitch, J. M. Harris, E. B. Dehan, B. A. Cozad, L. Christel, Y. Fathi, D. A. Hopkins, Jr., L. J. Lilly, W. McCulley, W. A. Weber, and M. Zdeblick, “Microfluidic MEMS for semiconductor processing.” IEEE Transactions on Components, Packaging, and Manufacturing Technology B21, pp. 329-337 (1998). Download PDF
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A. K. Henning, “Improvements to a compact, pressure- and structure-based compressible gas flow model for microvalves.” Submitted to IEEE/ASME Journal of Microelectromechanical Systems, February, 2004. Revised April, 2005. Download PDF
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A. K. Henning, “Comprehensive model for thermopneumatic actuators and microvalves.” IEEE/ASME Journal of Microelectromechanical Systems 15(5), pp. 1308-1318 (2006). Download PDF